Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks
- Dueñas, S.
- Castán, H.
- García, H.
- Gómez, A.
- Bailón, L.
- Toledano-Luque, M.
- Del Prado, A.
- Mártil, I.
- González-Díaz, G.
Aktak:
Proceedings of the 2009 Spanish Conference on Electron Devices, CDE'09
ISBN: 9781424428397
Argitalpen urtea: 2009
Orrialdeak: 1-4
Mota: Biltzar ekarpena
