Spatial analysis of electronic noise in submicron semiconductor structures

  1. González, T.
  2. Pardo, D.
  3. Varani, L.
  4. Reggiani, L.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 1993

Volumen: 63

Número: 1

Pages: 84-86

Type: Article

DOI: 10.1063/1.109705 GOOGLE SCHOLAR