High-frequency noise in FDSOI MOSFETs: A Monte Carlo investigation
- Rengel, R.
- Mateos, J.
- Pardo, D.
- González, T.
- Martín, M.J.
- Dambrine, G.
- Danneville, F.
- Raskin, J.-P.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X
Year of publication: 2003
Volume: 5113
Pages: 379-386
Type: Conference paper
