Onset of quasi-ballistic transport and mobility degradation in ultra scaled MOSFETs: A Monte Carlo study
- Martín, M.J.
- Rengel, R.
- Pascual, E.
- ŁUsakowski, J.
- Knap, W.
- González, T.
ISSN: 1862-6351
Year of publication: 2008
Volume: 5
Issue: 1
Pages: 123-126
Type: Conference paper