Monte Carlo analysis of III-V PIN diodes for tunnel-FETs and Impact Ionization-MOSFETs
- Vasallo, B.G.
- Talbo, V.
- Gonzalez, T.
- Lechaux, Y.
- Wichmann, N.
- Bollaert, S.
- Mateos, J.
Actas:
2017 Spanish Conference on Electron Devices, CDE 2017
ISBN: 9781509050727
Ano de publicación: 2017
Tipo: Achega congreso