Influence of ballistic and pocket effects on electron mobility in Si MOSFETs
- Łusakowski, J.
- Knap, W.
- Meziani, Y.
- Cesso, J.-P.
- El Fatimy, A.
- Tauk, R.
- Dyakonova, N.
- Ghibaudo, G.
- Boeuf, F.
- Skotnicki, T.
Actes de conférence:
Proceedings of ESSDERC 2005: 35th European Solid-State Device Research Conference
ISBN: 9780780392038
Année de publication: 2005
Volumen: 2005
Pages: 561-564
Type: Communication dans un congrès