Electronic transport and noise characterization in MoS2

  1. Pascual, E.
  2. Iglesias, J.M.
  3. Martín, M.J.
  4. Rengel, R.
Journal:
Semiconductor Science and Technology

ISSN: 1361-6641,  0268-1242

Year of publication: 2020

Volume: 35

Issue: 5

Type: Article

DOI: 10.1088/1361-6641/AB7777 GOOGLE SCHOLAR