Free form deformation-based image registration improves accuracy of traction force microscopy

  1. Jorge-Peñas, A.
  2. Izquierdo-Alvarez, A.
  3. Aguilar-Cuenca, R.
  4. Vicente-Manzanares, M.
  5. Garcia-Aznar, J.M.
  6. Van Oosterwyck, H.
  7. De-Juan-Pardo, E.M.
  8. Ortiz-De-Solorzano, C.
  9. Muñoz-Barrutia, A.
Aldizkaria:
PLoS ONE

ISSN: 1932-6203

Argitalpen urtea: 2015

Alea: 10

Zenbakia: 12

Mota: Artikulua

DOI: 10.1371/JOURNAL.PONE.0144184 GOOGLE SCHOLAR lock_openSarbide irekia editor

Garapen Iraunkorreko Helburuak