Raman signal reveals the rhombohedral crystallographic structure in ultra-thin layers of bismuth thermally evaporated on amorphous substrate

  1. Rodríguez-Fernández, C.
  2. Akius, K.
  3. Morais de Lima, M.
  4. Cantarero, A.
  5. van Ruitenbeek, J.M.
  6. Sabater, C.
Revista:
Materials Science and Engineering B: Solid-State Materials for Advanced Technology

ISSN: 0921-5107

Any de publicació: 2021

Volum: 270

Tipus: Article

DOI: 10.1016/J.MSEB.2021.115240 GOOGLE SCHOLAR