Classification of contaminated insulators using k-nearest neighbors based on computer vision
- Corso, M.P.
- Perez, F.L.
- Stefenon, S.F.
- Yow, K.-C.
- Ovejero, R.G.
- Leithardt, V.R.Q.
Revue:
Computers
ISSN: 2073-431X
Année de publication: 2021
Volumen: 10
Número: 9
Type: Article