A physically based model for resistive memories including a detailed temperature and variability description
- González-Cordero, G.
- González, M.B.
- García, H.
- Campabadal, F.
- Dueñas, S.
- Castán, H.
- Jiménez-Molinos, F.
- Roldán, J.B.
Revue:
Microelectronic Engineering
ISSN: 0167-9317
Année de publication: 2017
Volumen: 178
Pages: 26-29
Type: Article