MicroRaman and Hall effect study of n-type bulk 4H-SiC

  1. Chafai, M.
  2. Jiménez, J.
  3. Martin, E.
  4. Mitchel, W.C.
  5. Saxler, A.
  6. Perrin, R.
Proceedings:
Materials Science Forum

ISSN: 0255-5476

Year of publication: 2000

Volume: 338

Type: Article