Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7-x thin films

  1. Martínez, O.
  2. Jiménez, J.
  3. Chambonnet, D.
  4. Belouet, C.
Aldizkaria:
Journal of Materials Research

ISSN: 0884-2914

Argitalpen urtea: 2000

Alea: 15

Zenbakia: 5

Orrialdeak: 1069-1075

Mota: Artikulua

DOI: 10.1557/JMR.2000.0154 GOOGLE SCHOLAR