Study of defects in conformal GaAs/Si layers by optical techniques and photoetching
- Ardila, A.M.
- Martínez, O.
- Sanz, L.F.
- Avella, M.
- Jiménez, J.
- Napierala, J.
- Gil-Lafon, E.
- Gérard, B.
Revista:
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
ISSN: 0921-5107
Ano de publicación: 2002
Volume: 91-92
Páxinas: 70-74
Tipo: Achega congreso