An in situ transmission electron microscope study of the anomalous annealing of spatially isolated disordered zones in silicon

  1. Edmondson, P.D.
  2. Birtcher, R.C.
  3. Vishnyakov, V.M.
  4. Lopez, P.
  5. Pelaz, L.
  6. Marques, L.A.
  7. Donnelly, S.E.
Konferenzberichte:
Journal of Physics: Conference Series

ISSN: 1742-6596,  1742-6588

Datum der Publikation: 2006

Ausgabe: 26

Nummer: 1

Seiten: 284-287

Art: Konferenz-Beitrag

DOI: 10.1088/1742-6596/26/1/068 GOOGLE SCHOLAR lock_openOpen Access editor