Direct atomic imaging of antiphase boundaries and orthotwins in orientation-patterned GaAs

  1. Dos Reis, R.
  2. Ophus, C.
  3. Jimenez, J.
  4. Snure, M.
  5. Gérard, B.
  6. Liliental-Weber, Z.
Revista:
Applied Physics Letters

ISSN: 0003-6951

Ano de publicación: 2013

Volume: 102

Número: 8

Tipo: Artigo

DOI: 10.1063/1.4793651 GOOGLE SCHOLAR