Resistive Switching Properties of Atomic Layer Deposited ZrO 2 -HfO 2 Thin Films

  1. Ossorio, O.G.
  2. Dueñas, S.
  3. Castán, H.
  4. Tamm, A.
  5. Kalam, K.
  6. Seemen, H.
  7. Kukli, K.
Konferenzberichte:
Proceedings of the 2018 12th Spanish Conference on Electron Devices, CDE 2018

ISBN: 9781538657799

Datum der Publikation: 2018

Art: Konferenz-Beitrag

DOI: 10.1109/CDE.2018.8596925 GOOGLE SCHOLAR