Bragg-Fresnel optics for hard x-ray microscopy: Development of fabrication process and x-ray characterization at the Advanced Photon Source

  1. Li, Y.
  2. Wong, G.C.L.
  3. Safinya, C.R.
  4. Caine, E.
  5. Hu, E.L.
  6. Haeffner, D.
  7. Fernandez, P.
  8. Yun, W.
Aldizkaria:
Review of Scientific Instruments

ISSN: 0034-6748

Argitalpen urtea: 1998

Alea: 69

Zenbakia: 8

Orrialdeak: 2844-2848

Mota: Artikulua

DOI: 10.1063/1.1149022 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak