A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs

  1. Alonso-Gonzalez, C.J.
  2. Pulido, B.
  3. Carton, M.
  4. Bregon, A.
Aldizkaria:
IEEE Access

ISSN: 2169-3536

Argitalpen urtea: 2019

Alea: 7

Orrialdeak: 102160-102173

Mota: Artikulua

DOI: 10.1109/ACCESS.2019.2929111 GOOGLE SCHOLAR lock_openSarbide irekia editor