A new method for temperature mapping on GaAs field effect transistors

  1. Martin, E.
  2. Landesman, J.P.
  3. Braun, P.
  4. Fily, A.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 1998

Volumen: 38

Número: 6-8

Pages: 1245-1250

Type: Article

DOI: 10.1016/S0026-2714(98)00095-X GOOGLE SCHOLAR

Objectifs de Développement Durable