Sub-Micron Gate Length Field Effect Transistors as Broad Band Detectors of Terahertz Radiation
- Delgado Notario, J. A.
- Javadi, E.
- Calvo-Gallego, J.
- Diez, E.
- Velazquez, J. E.
- Meziani, Y. M.
- Fobelets, K.
- Ryzhii, M (coord.)
- Satou, A (coord.)
- Otsuji, T (coord.)
ISSN: 1793-1274
ISBN: 978-981-3223-28-8, 978-981-3223-27-1
Datum der Publikation: 2017
Ausgabe: 58
Seiten: 87-95
Kongress: 5th Russia-Japan-USA-Europe Symposium on Fundamental and Applied Problems of Terahertz Devices and Technologies (RJUSE-TeraTech)
Art: Konferenz-Beitrag