Artifacts-free fourier ptychographic microscopy using a misaligned setup

  1. Bianco, V.
  2. Mandracchia, B.
  3. Běhal, J.
  4. Barone, D.
  5. Memmolo, P.
  6. Ferraro, P.
Aktak:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 1996-756X,  0277-786X

ISBN: 9781510644069

Argitalpen urtea: 2021

Alea: 11786

Mota: Biltzar ekarpena

DOI: 10.1117/12.2592550 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak