Thermal dependence of the current in TiN/Ti/HfO2/W memristors at different intermediate conduction states

  1. Jiménez-Molinos, F.
  2. Vinuesa, G.
  3. García, H.
  4. Dueñas, S.
  5. Castán, H.
  6. González, M.B.
  7. Campabadal, F.
  8. Roldán, J.B.
Aldizkaria:
Materials Science in Semiconductor Processing

ISSN: 1369-8001

Argitalpen urtea: 2024

Alea: 179

Mota: Artikulua

DOI: 10.1016/J.MSSP.2024.108480 GOOGLE SCHOLAR lock_openSarbide irekia editor