The effect of substrate-induced defects on structural and resistive switching properties in Gd0.2Ca0.8MnO3 thin films

  1. Angervo, I.
  2. Antola, A.
  3. Schulman, A.
  4. Huhtinen, H.
  5. Paturi, P.
Revue:
AIP Advances

ISSN: 2158-3226

Année de publication: 2024

Volumen: 14

Número: 4

Type: Article

DOI: 10.1063/5.0185499 GOOGLE SCHOLAR lock_openAccès ouvert editor