Transport properties of resistive switching in Ag/Pr0.6Ca0.4MnO3/Al thin film structures

1. Lähteenlahti, V.
2. Schulman, A.
3. Huhtinen, H.
4. Paturi, P.

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DOI: 10.1016/J.JALLCOM.2019.01.279 GOOGLE SCHOLAR lock_openOpen access editor