Electronica
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Ohio State University
Columbus, Estados UnidosPublicaciones en colaboración con investigadores/as de Ohio State University (2)
2010
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Self-trapping in B-doped amorphous Si: Intrinsic origin of low acceptor efficiency
Physical Review B - Condensed Matter and Materials Physics, Vol. 81, Núm. 3
2008
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First principles study of boron in amorphous silicon
Materials Research Society Symposium Proceedings