Jaan Aarik-rekin lankidetzan egindako argitalpenak (2)
2017
-
RRAM Memories with ALD High-K Dielectrics: Electrical Characterization and Analytical Modeling
Thin Film Processes - Artifacts on Surface Phenomena and Technological Facets
2006
-
Disordered structure and density of gap states in high-permittivity thin solid films
DEFECTS IN HIGH-K GATE DIELECTRIC STACKS: NANO-ELECTRONIC SEMICONDUCTOR DEVICES