Materiales Semiconductores y Nanoestructuras para la Optoelectrónica
Nokia Foundation
Espoo, FinlandiaPublicacións en colaboración con investigadores/as de Nokia Foundation (3)
2000
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Analysis of grain orientation and intergrain properties by micro-Raman spectroscopy in YBa2Cu3O7-x thin films
Journal of Materials Research, Vol. 15, Núm. 5, pp. 1069-1075
1996
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A microraman study of the structural properties of PLD high Tc superconducting thin films
Physica C: Superconductivity and its Applications, Vol. 270, Núm. 1-2, pp. 144-154
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Oxygen content of YBaCuO thin films
Physica C: Superconductivity and its Applications, Vol. 256, Núm. 3-4, pp. 291-297