Juan Barbolla Sánchez-rekin lankidetzan egindako argitalpenak (6)

2006

  1. Disordered structure and density of gap states in high-permittivity thin solid films

    DEFECTS IN HIGH-K GATE DIELECTRIC STACKS: NANO-ELECTRONIC SEMICONDUCTOR DEVICES

1998

  1. Conductance transients study of slow traps in Al/SiNx : H/Si and Al/SiNx : H/InP metal-insulator-semiconductor structures

    ELECTRICALLY BASED MICROSTRUCTURAL CHARACTERIZATION II

1996

  1. Determination of three-dimensional deep level defect distribution by capacitance-voltage transient technique (CVTT)

    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS 1995

1994

  1. A STUDY OF CHANNELING AND INDUCED DAMAGE IN BORON-IMPLANTED SILICON

    DEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES

1987

  1. Aplicación de la DLOS a semiconductores compensados

    XXI Reunión bienal de la Real Sociedad española de Física: programa, Salamanca 4 al 10 de octubre, 1987

  2. Caracterización del centro EL2 del GaAs por espectroscopia óptica de la admitancia

    XXI Reunión bienal de la Real Sociedad española de Física: programa, Salamanca 4 al 10 de octubre, 1987