Evaristo José
Abril Domingo
Universidad Complutense de Madrid
Madrid, EspañaUniversidad Complutense de Madrid-ko ikertzaileekin lankidetzan egindako argitalpenak (5)
1997
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Application of high-resolution X-ray diffractometry to the structural study of epitaxial multilayers on novel index surfaces
Microelectronics Journal, Vol. 28, Núm. 8-10, pp. 777-784
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High-resolution X-ray diffraction characterisation of piezoelectric InGaAs/GaAs multiquantum wells and superlattices on (lll)B GaAs
Nuovo Cimento della Societa Italiana di Fisica D - Condensed Matter, Atomic, Molecular and Chemical Physics, Biophysics, Vol. 19, Núm. 2-4, pp. 329-337
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Observation of non-trigonal lattice distortion in pseudomorphic InGaAs/ GaAs superlattices grown on misoriented (111)B GaAs
Journal of Applied Physics, Vol. 82, Núm. 7, pp. 3297-3305
1996
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High-resolution x-ray diffraction study of piezoelectric InGaAs/GaAs multiquantum well p-i-n photodiodes grown on (111)B GaAs
Applied Physics Letters, Vol. 69, Núm. 11, pp. 1574-1576
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Probing resonant tunneling and charge accumulation via capacitance measurements in [111]-oriented InGaAs/GaAs MQW and superlattices
Solid-State Electronics, Vol. 40, Núm. 1-8, pp. 591-595