Publicaciones en las que colabora con Salvador Dueñas Carazo (2)

1987

  1. Optical admittance spectroscopy: A new method for deep level characterization

    Journal of Applied Physics, Vol. 61, Núm. 7, pp. 2541-2545

1986

  1. Electron thermal emission rates of nickel centers in silicon

    Solid State Electronics, Vol. 29, Núm. 9, pp. 883-884