Publications by the researcher in collaboration with Jose Emiliano Rubio Garcia (41)
2019
-
An Efficient Microkinetic Modeling Protocol: Start with only the Dominant Mechanisms, Adjust All Parameters, and Build the Complete Model Incrementally
ACS Catalysis, Vol. 9, Núm. 6, pp. 4804-4809
2018
-
15-Hydroxygermacranolides as Sources of Structural Diversity: Synthesis of Sesquiterpene Lactones by Cyclization and Rearrangement Reactions. Experimental and DFT Study
Journal of Organic Chemistry, Vol. 83, Núm. 10, pp. 5480-5495
-
Sulfur Hydrogen Bonding in Isolated Monohydrates: Furfuryl Mercaptan versus Furfuryl Alcohol
Chemistry - A European Journal, Vol. 24, Núm. 25, pp. 6564-6571
2017
-
A DFT-Based Computational-Experimental Methodology for Synthetic Chemistry: Example of Application to the Catalytic Opening of Epoxides by Titanocene
Journal of Organic Chemistry, Vol. 82, Núm. 7, pp. 3760-3766
-
Rotational spectra of tetracyclic quinolizidine alkaloids: Does a water molecule flip sparteine?
Physical Chemistry Chemical Physics, Vol. 19, Núm. 27, pp. 17553-17559
2011
2010
-
Atomistic modeling of defect diffusion and interdiffusion in SiGe heterostructures
Thin Solid Films, Vol. 518, Núm. 9, pp. 2448-2453
2008
-
Comprehensive model of damage accumulation in silicon
Journal of Applied Physics, Vol. 103, Núm. 1
-
The use of extended-defect dissolution as a probe for stress-induced interstitial diffusion anisotropy
Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 154-155, Núm. 1-3, pp. 260-263
2007
-
Atomistic modeling and physical comprehension of the effects of implant dose rate on boron activation in pMOSFET S/D
ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference
-
Atomistic modeling of defect diffusion in SiGe
2007 International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2007
-
Current capabilities and future prospects of atomistic process simulation
Technical Digest - International Electron Devices Meeting, IEDM
2006
-
Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth
Materials Research Society Symposium Proceedings
-
Modeling charged defects, dopant diffusion and activation mechanisms for TCAD simulations using kinetic Monte Carlo
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 253, Núm. 1-2, pp. 63-67
2005
-
Bimodal distribution of damage morphology generated by ion implantation
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
-
Comprehensive modeling of ion-implant amorphization in silicon
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
-
Dose loss and segregation of boron and arsenic at the Si/SiO2 interface by atomistic kinetic Monte Carlo simulations
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
-
Fermi-level effects in semiconductor processing: A modeling scheme for atomistic kinetic Monte Carlo simulators
Journal of Applied Physics, Vol. 98, Núm. 5
-
Ion-beam amorphization of semiconductors: A physical model based on the amorphous pocket population
Journal of Applied Physics, Vol. 98, Núm. 4
-
Ion-implant simulations: The effect of defect spatial correlation on damage accumulation
Materials Science and Engineering B: Solid-State Materials for Advanced Technology