Juan Ignacio
Jimenez Lopez
Consiglio Nazionale delle Ricerche
Roma, ItaliaPublikationen in Zusammenarbeit mit Forschern von Consiglio Nazionale delle Ricerche (26)
2015
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Evidence of chlorine ion penetration in InP/InAsP quantum well structures during dry etching processes and effects of induced-defects on the electronic and structural behaviour
Microelectronics Reliability, Vol. 55, Núm. 9-10, pp. 1750-1753
2010
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Factors affecting the luminescence emission of InGaN multi-quantum wells grown on (0001) sapphire substrates by MOVPE
Physica Status Solidi (C) Current Topics in Solid State Physics
2006
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Characterisation of GaAsN layers grown by MOVPE
Journal of Crystal Growth
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Origin of the fluctuations in the luminescence emission in InGaN quantum wells
Materials Science in Semiconductor Processing, Vol. 9, Núm. 1-3, pp. 2-7
2005
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Microscopic optical interferometry study of the cottrell atmospheres in Si-Doped GaAs
Recent Advances in Multidisciplinary Applied Physics (Elsevier Ltd), pp. 217-221
2004
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Compositional and optical uniformity of InGaN layers deposited on (0001) sapphire by metal-organic vapour phase epitaxy
Semiconductor Science and Technology, Vol. 19, Núm. 2, pp. 147-151
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Influence of substrate growth temperature on the Cu-Pt type ordering in lattice-matched GaInP/GaAs heterostructures
EPJ Applied Physics
2003
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Characterization of GaN/InGaN hetero-structures by Raman spectroscopy, PL and CL
Conference Proceedings - International Conference on Indium Phosphide and Related Materials
2002
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Characterization of GaN/InGaN hetero-structures by SEM and CL
IEEE Semiconducting and Semi-Insulating Materials Conference, SIMC
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Optical and structural characterization of LP MOVPE grown lattice matched InGaP/GaAs heterostructures
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
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Photocurrent and photoluminescence in Fe-doped InP
IEEE Semiconducting and Semi-Insulating Materials Conference, SIMC
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Raman and photoluminescence mapping of lattice matched InGaP/GaAs heterostructures
Materials Research Society Symposium - Proceedings, Vol. 692, pp. 91-96
2000
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Homogeneity of thermally-annealed lightly Fe-doped SI InP
Materials Research Society Symposium - Proceedings
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On the absence of decoration As precipitates at dislocations in Te-doped GaAs
Journal of Physics Condensed Matter, Vol. 12, Núm. 49, pp. 10335-10342
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Uniformity of semi-insulating InP wafers obtained by Fe diffusion
Journal of Applied Physics, Vol. 88, Núm. 9, pp. 5225-5229
1999
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Study of the dislocations in Si-doped GaAs comparing diluted Sirtl light etching, electron-beam-induced current, and micro-Raman techniques
Journal of Materials Research, Vol. 14, Núm. 5, pp. 1732-1743
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Uniformity of Fe-diffused semi-insulating InP wafers
Conference Proceedings - International Conference on Indium Phosphide and Related Materials, pp. 259-262
1998
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Annealing-related phenomena in bulk semi-insulating indium phosphide
Defect and Diffusion Forum
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Annealing-related phenomena in bulk semi-insulating indium phosphide
Defect and Diffusion Forum, Vol. 157-159, pp. 103-112
1997
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Analysis of large impurity atmospheres at dislocations and associated point defect reactions in differently n-doped GaAs crystals
Journal de Physique III, Vol. 7, Núm. 12, pp. 2339-2360