Publikationen in Zusammenarbeit mit Forschern von Consiglio Nazionale delle Ricerche (26)

2006

  1. Characterisation of GaAsN layers grown by MOVPE

    Journal of Crystal Growth

  2. Origin of the fluctuations in the luminescence emission in InGaN quantum wells

    Materials Science in Semiconductor Processing, Vol. 9, Núm. 1-3, pp. 2-7

2005

  1. Microscopic optical interferometry study of the cottrell atmospheres in Si-Doped GaAs

    Recent Advances in Multidisciplinary Applied Physics (Elsevier Ltd), pp. 217-221

2003

  1. Characterization of GaN/InGaN hetero-structures by Raman spectroscopy, PL and CL

    Conference Proceedings - International Conference on Indium Phosphide and Related Materials

2002

  1. Characterization of GaN/InGaN hetero-structures by SEM and CL

    IEEE Semiconducting and Semi-Insulating Materials Conference, SIMC

  2. Optical and structural characterization of LP MOVPE grown lattice matched InGaP/GaAs heterostructures

    Materials Science and Engineering B: Solid-State Materials for Advanced Technology

  3. Photocurrent and photoluminescence in Fe-doped InP

    IEEE Semiconducting and Semi-Insulating Materials Conference, SIMC

  4. Raman and photoluminescence mapping of lattice matched InGaP/GaAs heterostructures

    Materials Research Society Symposium - Proceedings, Vol. 692, pp. 91-96

2000

  1. Homogeneity of thermally-annealed lightly Fe-doped SI InP

    Materials Research Society Symposium - Proceedings

  2. On the absence of decoration As precipitates at dislocations in Te-doped GaAs

    Journal of Physics Condensed Matter, Vol. 12, Núm. 49, pp. 10335-10342

  3. Uniformity of semi-insulating InP wafers obtained by Fe diffusion

    Journal of Applied Physics, Vol. 88, Núm. 9, pp. 5225-5229

1999

  1. Study of the dislocations in Si-doped GaAs comparing diluted Sirtl light etching, electron-beam-induced current, and micro-Raman techniques

    Journal of Materials Research, Vol. 14, Núm. 5, pp. 1732-1743

  2. Uniformity of Fe-diffused semi-insulating InP wafers

    Conference Proceedings - International Conference on Indium Phosphide and Related Materials, pp. 259-262