Valladolid
Universidad
Oak Ridge National Laboratory
Oak Ridge, Estados UnidosPublicaciones en colaboración con investigadores/as de Oak Ridge National Laboratory (11)
2021
-
Peachy Parallel Assignments (EduHPC 2021)
Proceedings of EduHPC 2021: Workshop on Education for High-Performance Computing, Held in conjunction with SC 2021: The International Conference for High Performance Computing, Networking, Storage and Analysis
2020
-
TRY plant trait database – enhanced coverage and open access
Global Change Biology, Vol. 26, Núm. 1, pp. 119-188
2007
-
Ab initio molecular dynamics simulations of the static, dynamic, and electronic properties of liquid Pb using real-space pseudopotentials
Physical Review B - Condensed Matter and Materials Physics, Vol. 76, Núm. 21
2004
-
Radiation-enhanced diffusion of Sb and B in silicon during implantation below 400 ° C
Physical Review B - Condensed Matter and Materials Physics, Vol. 69, Núm. 12
2003
-
Enhanced low temperature electrical activation of B in Si
Applied Physics Letters, Vol. 82, Núm. 2, pp. 215-217
2001
-
Binding energy of vacancy clusters generated by high-energy ion implantation and annealing of silicon
Applied Physics Letters, Vol. 79, Núm. 9, pp. 1273-1275
1999
-
Mechanism for the reduction of interstitial supersaturations in MeV-implanted silicon
Applied Physics Letters, Vol. 74, Núm. 9, pp. 1299-1301
1998
-
Critical issues in ion implantation of silicon below 5 keV: Defects and diffusion
Materials Science and Engineering A, Vol. 253, Núm. 1-2, pp. 269-274
-
Damage, defects and diffusion from ultra-low energy (0-5 keV) ion implantation of silicon
Materials Science in Semiconductor Processing, Vol. 1, Núm. 1, pp. 17-25
1997
-
Physical mechanisms of transient enhanced dopant diffusion in ion-implanted silicon
Journal of Applied Physics, Vol. 81, Núm. 9, pp. 6031-6050
-
Reduction of transient diffusion from 1-5 keV Si+ ion implantation due to surface annihilation of interstitials
Applied Physics Letters, Vol. 71, Núm. 21, pp. 3141-3143