Conductance-transient three-dimensional profiling of disordered induced gap states on metal-insulator-semiconductor structures

  1. Castan, H.
  2. Duenas, S.
  3. Barbolla, J.
  4. Martil, I.
  5. González-Díaz, G.
Actes de conférence:
Materials Research Society Symposium - Proceedings

ISSN: 0272-9172

Année de publication: 2002

Volumen: 699

Pages: 231-236

Type: Communication dans un congrès

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