Stark width measurement of several OII lines
- del Val, J.A.
- Aparicio, J.A.
- Mar, S.
Aktak:
Proceedings of SPIE - The International Society for Optical Engineering
ISSN: 0277-786X
Argitalpen urtea: 1999
Alea: 3572
Orrialdeak: 542-546
Mota: Artikulua