Sensitivity of single-and double-gate MOS architectures to residual discrete dopant distribution in the channel

  1. Dollfus, P.
  2. Bournel, A.
  3. Velázquez, J.E.
Aldizkaria:
Journal of Computational Electronics

ISSN: 1572-8137,  1569-8025

Argitalpen urtea: 2006

Alea: 5

Zenbakia: 2-3

Orrialdeak: 119-123

Mota: Artikulua

DOI: 10.1007/S10825-006-8830-5 GOOGLE SCHOLAR