Logic Gates Based on Synthetic Antiferromagnetic Bilayer Skyrmions
- Fattouhi, M.
- Mak, K.Y.
- Zhou, Y.
- Zhang, X.
- Liu, X.
- El Hafidi, M.
Journal:
Physical Review Applied
ISSN: 2331-7019
Year of publication: 2021
Volume: 16
Issue: 1
Type: Article