Analysis of the white emission from ion beam synthesised layers by in-depth resolved scanning photoluminescence microscopy

  1. González-Varona, O.
  2. Garrido, B.
  3. Pérez-Rodríguez, A.
  4. Morante, J.R.
  5. Bonafos, C.
  6. Carrada, M.
  7. Sanz, L.F.
  8. González, M.A.
  9. Jiménez, J.
Zeitschrift:
Materials Science and Engineering B: Solid-State Materials for Advanced Technology

ISSN: 0921-5107

Datum der Publikation: 2002

Ausgabe: 91-92

Seiten: 51-54

Art: Konferenz-Beitrag

DOI: 10.1016/S0921-5107(01)00967-9 GOOGLE SCHOLAR