Design and optimization of nanoCMOS devices using predictive atomistic physics-based process modeling
- Colombeau, B.
- Mok, K.R.C.
- Yeong, S.H.
- Bénistant, F.
- Indajang, B.
- Tan, O.
- Yang, B.
- Li, Y.
- Jaraiz, M.
- Cowern, N.E.B.
- Chu, S.
Konferenzberichte:
Technical Digest - International Electron Devices Meeting, IEDM
ISSN: 0163-1918
ISBN: 9781424404391
Datum der Publikation: 2006
Art: Konferenz-Beitrag