Modeling and experimental characterization of stepped and v-shaped {311} defects in silicon
- Marqués, L.A.
- Aboy, M.
- Dudeck, K.J.
- Botton, G.A.
- Knights, A.P.
- Gwilliam, R.M.
ISSN: 1089-7550, 0021-8979
Any de publicació: 2014
Volum: 115
Número: 14
Tipus: Article