Study from cryogenic to high temperatures of the high- and low-resistance-state currents of ReRAM Ni-HfO2-Si capacitors
- Vaca, C.
- Gonzalez, M.B.
- Castan, H.
- Garcia, H.
- Duenas, S.
- Campabadal, F.
- Miranda, E.
- Bailon, L.A.
ISSN: 0018-9383
Year of publication: 2016
Volume: 63
Issue: 5
Pages: 1877-1883
Type: Article