Defect recognition by means of light and electron probe techniques for the characterization of mc-Si wafers and solar cells

  1. Moralejo, B.
  2. Tejero, A.
  3. Hortelano, V.
  4. Martínez, O.
  5. González, M.A.
  6. Jiménez, J.
Aldizkaria:
Superlattices and Microstructures

ISSN: 1096-3677,  0749-6036

Argitalpen urtea: 2016

Alea: 99

Orrialdeak: 45-53

Mota: Artikulua

DOI: 10.1016/J.SPMI.2016.02.005 GOOGLE SCHOLAR lock_openUVADOC editor