Defect recognition by means of light and electron probe techniques for the characterization of mc-Si wafers and solar cells

  1. Moralejo, B.
  2. Tejero, A.
  3. Hortelano, V.
  4. Martínez, O.
  5. González, M.A.
  6. Jiménez, J.
Revue:
Superlattices and Microstructures

ISSN: 1096-3677,  0749-6036

Année de publication: 2016

Volumen: 99

Pages: 45-53

Type: Article

DOI: 10.1016/J.SPMI.2016.02.005 GOOGLE SCHOLAR lock_openUVADOC editor