Trapping activity on multicrystalline Si wafers studied by combining fast PL imaging and high resolved electrical techniques
- Martinez, O.
- Moralejo, B.
- Hortelano, V.
- Tejero, A.
- Gonzalez, M.A.
- Jimenez, J.
- Mass, J.
- Parra, V.
Actes de conférence:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013
ISBN: 9781467346689
Année de publication: 2013
Pages: 361-364
Type: Communication dans un congrès