Trapping activity on multicrystalline Si wafers studied by combining fast PL imaging and high resolved electrical techniques

  1. Martinez, O.
  2. Moralejo, B.
  3. Hortelano, V.
  4. Tejero, A.
  5. Gonzalez, M.A.
  6. Jimenez, J.
  7. Mass, J.
  8. Parra, V.
Actas:
Proceedings of the 2013 Spanish Conference on Electron Devices, CDE 2013

ISBN: 9781467346689

Ano de publicación: 2013

Páxinas: 361-364

Tipo: Achega congreso

DOI: 10.1109/CDE.2013.6481417 GOOGLE SCHOLAR