Publicacións en colaboración con investigadores/as de Universidad de Buenos Aires (2)

2018

  1. Electrical Characterization of Defects Created by γ-Radiation in HfO2-Based MIS Structures for RRAM Applications

    Journal of Electronic Materials

2011

  1. Electrical characteristics of metal-insulator-semiconductor structures with atomic layer deposited Al2 O3, HfO2, and nanolaminates on different silicon substrates

    Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics