2016

1. Electrical properties and nanoresistive switching of Ni-HfO2-Si capacitors

   ECS Transactions

2. Study from cryogenic to high temperatures of the high- and low-resistance-state currents of ReRAM Ni-HfO2-Si capacitors

   IEEE Transactions on Electron Devices, Vol. 63, Núm. 5, pp. 1877-1883