Juan Ignacio
Jimenez Lopez
Instituto de Ciencias de la Tierra Jaume Almera
Barcelona, EspañaPublicacions en col·laboració amb investigadors/es de Instituto de Ciencias de la Tierra Jaume Almera (16)
2016
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Cathodoluminescence study of Mg activation in non-polar and semi-polar faces of undoped/Mg-doped GaN core-shell nanorods
Nanotechnology, Vol. 27, Núm. 9
2014
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Electron density gradients in ammonothermally grown Si-doped GaN
Applied Physics Express, Vol. 7, Núm. 2
2012
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Raman scattering by the E 2h and A 1(LO) phonons of In xGa 1-xN epilayers (0.25 < x < 0.75) grown by molecular beam epitaxy
Journal of Applied Physics, Vol. 111, Núm. 6
2008
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Raman scattering and cathodoluminescence characterization of near lattice-matched InxAl1-xN epilayers
Semiconductor Science and Technology, Vol. 23, Núm. 10
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Raman scattering of quasimodes in ZnO
Journal of Physics Condensed Matter, Vol. 20, Núm. 44
2007
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Raman scattering characterization of implanted ZnO
Materials Research Society Symposium Proceedings
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Study of the temperature dependence of E2 and Al(LO) modes in ZnO
Materials Research Society Symposium Proceedings
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Temperature dependence of Raman scattering in ZnO
Physical Review B - Condensed Matter and Materials Physics, Vol. 75, Núm. 16
2006
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Origin of the fluctuations in the luminescence emission in InGaN quantum wells
Materials Science in Semiconductor Processing, Vol. 9, Núm. 1-3, pp. 2-7
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Substrate influence on the high-temperature annealing behavior of GaN: Si vs. sapphire
Materials Research Society Symposium Proceedings
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The effect of substrate on high-temperature annealing of GaN epilayers: Si versus sapphire
Journal of Applied Physics, Vol. 100, Núm. 4
2005
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Optical characterisation of Bi-doped GaN films grown by molecular beam epitaxy
Physica Status Solidi (A) Applications and Materials Science
2004
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Optical properties of epitaxial lateral overgrowth GaN structures studied by Raman and cathodoluminescence spectroscopies
Journal of Applied Physics, Vol. 96, Núm. 7, pp. 3639-3644
2002
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Raman scattering by an inhomogeneous plasma in implanted semiconductors
Solid State Communications, Vol. 121, Núm. 11, pp. 609-613
2001
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Evaluation of free-carrier concentration in Si+-implanted InP by means of photoluminescence
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
1999
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Characterization of the electron density in si+-implanted inp by means of raman scattering by lo-plasma coupled modes
Materials Research Society Symposium - Proceedings, Vol. 540, pp. 97-102