Publicaciones en colaboración con investigadores/as de University of Modena and Reggio Emilia (7)

2021

  1. Standards for the Characterization of Endurance in Resistive Switching Devices

    ACS Nano, Vol. 15, Núm. 11, pp. 17214-17231

1997

  1. Monte Carlo analysis of electronic noise in semiconductor materials and devices

    Microelectronics Journal, Vol. 28, Núm. 2, pp. 183-198

1995

  1. Monte Carlo Analysis of the Behavior and Spatial Origin of Electronic Noise in GaAs MESFET's

    IEEE Transactions on Electron Devices, Vol. 42, Núm. 5, pp. 991-998

1994

  1. Hot-carrier fluctuations from ballistic to diffusive regime in submicron semiconductor structures

    Semiconductor Science and Technology, Vol. 9, Núm. 5 S, pp. 584-587

1993

  1. Monte Carlo analysis of noise spectra in Schottky-barrier diodes

    Applied Physics Letters, Vol. 63, Núm. 22, pp. 3040-3042

  2. Spatial analysis of electronic noise in submicron semiconductor structures

    Applied Physics Letters, Vol. 63, Núm. 1, pp. 84-86

  3. The microscopic interpretation of electron noise in Schottky-barrier diodes

    European Solid-State Device Research Conference